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Application of Machine Learning Techniques in Post-Silicon Debugging and Bug Localization., and . J. Electron. Test., 34 (2): 163-181 (2018)Accelerating Deep Neural Networks Using FPGA., , , , , and . ICM, page 176-179. IEEE, (2018)Tutorial 1: Foundations and Practical Design of CMOS Image Sensors., , , , , , , , , and 1 other author(s). ICECS, IEEE, (2013)Guiding intelligent testbench automation using data mining and formal methods., and . IDT, page 60-65. IEEE, (2015)Construction of coverage data for post-silicon validation using big data techniques., , , , , and . ICECS, page 46-49. IEEE, (2017)Covgen: A framework for automatic extraction of functional coverage models., and . ISQED, page 146-151. IEEE, (2016)Hardware-Accelerated ZYNQ-NET Convolutional Neural Networks on Virtex-7 FPGA., , , , , , , , , and 1 other author(s). ICM, page 70-73. IEEE, (2021)Accelerating the debugging of FV traces using K-means clustering techniques., and . IDT, page 278-283. IEEE, (2016)Tutorial 2: "Challenges of FPGA-based prototyping & debugging"., and . IDT, page xv-xvi. IEEE, (2016)Application of six-sigma DMAIC methodology in the evaluation of test effectiveness: A case study for EDA tools.. ISQED, page 434-441. IEEE, (2014)