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Guest Editorial Memristive-Device-Based Computing., , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (12): 2581-2583 (2018)Alternative Architectures Toward Reliable Memristive Crossbar Memories., , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 206-217 (2016)Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era., , , , and . IEEE Access, (2019)New data-background sequences and their industrial evaluation for word-oriented random-access memories., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 24 (6): 892-904 (2005)Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (12): 2989-2996 (2006)DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs., , , , and . ETS, page 1-2. IEEE, (2019)Testing Resistive Memories: Where are We and What is Missing?, , and . ITC, page 1-9. IEEE, (2018)Bias Temperature Instability analysis of FinFET based SRAM cells., , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)ETS 2016 foreword., , , , and . ETS, page 1. IEEE, (2016)Methodology for Application-Dependent Degradation Analysis of Memory Timing., , , , , , and . DATE, page 162-167. IEEE, (2019)