%0 Journal Article %1 journals/tcad/JoeMPR24 %A Joe, Jerin %A Mukherjee, Nilanjan %A Pomeranz, Irith %A Rajski, Janusz %D 2024 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 2 %P 694-703 %T Generation of Two-Cycle Tests for Structurally Similar Circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad43.html#JoeMPR24 %V 43

@article{journals/tcad/JoeMPR24, added-at = {2024-02-29T00:00:00.000+0100}, author = {Joe, Jerin and Mukherjee, Nilanjan and Pomeranz, Irith and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/24a7f957ac7f8a8e71d00c21fc855f0da/dblp}, ee = {https://doi.org/10.1109/TCAD.2023.3321973}, interhash = {94c2d81dd7833f2e8f04af5356b93090}, intrahash = {4a7f957ac7f8a8e71d00c21fc855f0da}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, month = {February}, number = 2, pages = {694-703}, timestamp = {2024-04-08T19:46:45.000+0200}, title = {Generation of Two-Cycle Tests for Structurally Similar Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad43.html#JoeMPR24}, volume = 43, year = 2024 }