Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/eswa/WongYFCF09
%A Wong, Wai Keung
%A Yuen, C. W. M.
%A Fan, D. D.
%A Chan, L. K.
%A Fung, E. H. K.
%D 2009
%J Expert Syst. Appl.
%K dblp
%N 2
%P 3845-3856
%T Stitching defect detection and classification using wavelet transform and BP neural network.
%U http://dblp.uni-trier.de/db/journals/eswa/eswa36.html#WongYFCF09
%V 36
@article{journals/eswa/WongYFCF09,
added-at = {2013-11-27T00:00:00.000+0100},
author = {Wong, Wai Keung and Yuen, C. W. M. and Fan, D. D. and Chan, L. K. and Fung, E. H. K.},
biburl = {https://www.bibsonomy.org/bibtex/2e007fee951884ae4e67f7fbe0046de37/dblp},
ee = {http://dx.doi.org/10.1016/j.eswa.2008.02.066},
interhash = {675e9b08ed41171eff00907f087c4e35},
intrahash = {e007fee951884ae4e67f7fbe0046de37},
journal = {Expert Syst. Appl.},
keywords = {dblp},
number = 2,
pages = {3845-3856},
timestamp = {2013-11-28T11:32:30.000+0100},
title = {Stitching defect detection and classification using wavelet transform and BP neural network.},
url = {http://dblp.uni-trier.de/db/journals/eswa/eswa36.html#WongYFCF09},
volume = 36,
year = 2009
}
